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Feature extraction based on high order statistics measures and entropy for EEG biometrics
Conference proceeding

Feature extraction based on high order statistics measures and entropy for EEG biometrics

S. Li and S.-H. Cha
2019 7th International Workshop on Biometrics and Forensics, IWBF 2019, pp.1-6
7th International Workshop on Biometrics and Forensics (IWBF) (Cancun, Mexico, 05/02/2019 - 05/03/2019)
2019

Abstract

Entropy Brain--Models Biometry Electroencephalography
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